40 GHz 100 & 50 ohm TDR Hand Probe: the model DVT40 GigaProbes® is a robust balanced 40Ghz 100Ω differential probe capable of making 50 Ω measurements with <3.5ps TDR Fall Time degradation. The DVT40 is like having two 40 GHz probes in one making it compatible with the fastest TDR modules from Tektronix, Agilent and LeCroy.
Make Accurate Time and Frequency Measurements: to make accurate time and frequency measurements S4P S-Parameters are available for each probe and used to deembed the probe characteristics from the measurements. In addition, the NEW 40 GHz differential Y connector assembly is optimized to significantly reduce reflection and frequency loss. Combined, these features improve measurement accuracy and extend the measurement bandwidth range.
Everything you need to Characterize Gb/s Interconnects in the time or frequency domain: The DVT40-1MM kit comes in an elegant wooden box containing two DVT40 probes for measuring differential 100 ohm Time Domain Reflectometry (TDR) impedance (Zline) measurements. Once impedance sensitive transmission lines are verified, use the second probe as a receiver to measure Time Domain Transmission (TDT) measurements. These odd mode differential measurements can be converted into differential insertion (SDD21) and return loss (SDD21) S-parameters (S2P) to verify differential transmission lines meet bandwidth performance. To measure the full spectrum of odd and even waveforms contained in a (S4P) S-parameters. Attach the optional Ground Pin Collars that contain replaceable .5 OD compliant ground pins to form Signal/Ground configurations (GSGSG, GSS, SSG, SGS, GSSG and SS with a SG pin spacing of 1mm) that meet the physical layout of the pads on your PCB. Import the S4p de embedding files for the probes to extend the measurement accuracy. The new DVT40 provides the flexibility to make low loss 50 ohm, 100 ohm and multi-mode measurements in order to validate industry design standards such as USB3, PCI/E Gen3, SATA/SAS, 10 G Base-R FEC, etc.
Adapters are provided to install the DVT40 in low cost probe manipulators, eliminating the need for expensive probe stations for high bandwidth hands-free probing. This capability frees the Signal Integrity Engineer to operate test instrument and to manipulate enhanced impedance and S-parameter software to accurately characterize differential impedances on the Gigabit: PCB’s, device test boards, backplanes, connectors, and cables.
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