ADK is a comprehenive set of SI utility tools to simplify many commonly encountered SI tasks to a single mouse click. ADK has been used daily for many years in major hardware companies. With ADK, new graduates can be trained to perform the tasks of middle-level SI engineers within a day.
ADK corrects causality violation and outputs new Touchstone files for better channel simulation and impedance reading. Note how much the S parameters can change after causality correction.
Converting S parameters into equivalent HSPICE models is just one mouse click away. Attempts to curvefit non-causal models will be futile. ADK's causality correction ensures that the curvefitted models are also valid beyond the original frequency range.
Going from S parameters to optimized TX FFE and RX CTLE and DFE coefficients and eye diagrams in NRZ or PAM-4 is again only one mouse click away.
Are you still using a resonator to measure DK and DF? ADK extracts frequency-dependent DK and DF that are causal and self-consistent with the insertion loss of multiple traces. In just one mouse click in ADK, material characterization cannot be easier.
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